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Aqualog
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Duetta
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X-ray Fluorescence Analyzers [XRF]
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XGT-9000 | X-ray Analytical Microscope
XGT-9000SL | X-ray Analytical Microscope Super Large Chamber Model
MESA-50 | X-Ray Fluorescence Analyzer
MESA-50K | X-Ray Fluorescence Analyzer
Glow Discharge Optical Emission Spectrometry (GDOES)
GD-Profiler 2
ICP-OES Spectrometers
Ultima Expert
Ultima Expert LT
Carbon, Sulfur, Oxygen, Nitrogen and Hydrogen Analyzers
Application corner
EMIA-Pro | C/S Analyzer
EMIA-Expert | C/S Analyzer
EMIA-Step | C/S Analyzer
EMGA-Pro | O/N/H Analyzer
EMGA-Expert | O/N/H Analyzer
EMGA-920 | O/N Analyzer
EMGA-921 | H Analyzer
EMGA-930 | O/N/H Analyzer
Sulfur-in-Oil
Sulfur-in-Oil Home
Energy Dispersive X-ray Fluorescence
Combustion Elemental Analysis
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SLFA-60
SLFA-6000
MESA-7220V2
MESA-7220
X-5000
XPLORER-NS
XPLORER-TX/TS
Particle Characterization
Particle Size
Particle Shape
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Surface Area
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Partica LA-960V2
Partica mini LA-350
ViewSizer 3000
nanoPartica SZ-100V2 Series
Eyecon2™
PSA300
SA-9600 Series
Kundenspezifische Spektroskopie-Lösungen
Modular Raman
Photoluminescence
Microscope Spectrometers
Darkfield Scattering
Electroluminescence and Photocurrent
Reflectance and Transmittance
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Micro-Photoluminescence
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Time Resolved Fluorescence
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Light Sources
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Mini-Spektrometer und wissenschaftliche Kameras für OEMs
Grating Spectrometers
OEM Deep-Cooled Scientific Cameras
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Compact VUV CCD Spectrometer
Hyperspectral Imaging System
Imaging Scanning Monochromator
Miniature Spectrometers
Mini Raman Spectrometers
Multispectra Spectrometers
OES Spectrometers
PoliSpectra RPR Raman Plate Reader
UV-Vis-NIR Spectrometers
Beugungsgitter für industrielle OEM und wissenschaftliche Forschung
Beugungsgitter für industrielle OEM
Beugungsgitter für wissenschaftliche Anwendungen
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Blazed holographic plane gratings
Flat field and imaging gratings - Type IV
Gratings - Laser Pulse Compression Gratings
Gratings for astronomy
Gratings for Space-Flight
Gratings for Synchrotron, FEL and EUV light sources
Holographic concave gratings - Type I
Holographic plane gratings
Monochromator gratings - Type IV
Ruled plane gratings
Surface Plasmon Resonance imaging (SPRi)
OpenPleX
SPRi-Arrayer
Spectroscopic Ellipsometry
UVISEL Plus
Auto SE
Smart SE
Forensics
Forensics Light Sources
RUVIS
Imaging
AFIS
Goggles & Camera Filters
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CrimeScope CS-16-500W | Forensic Light Source
FOCUS PRO | Forensic Light Source
Mini-CrimeScope Advance | Forensic Light Source
SceneScope RUVIS UHD | Imaging System
Universal Imaging System
PrintQuest
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Cathodoluminescence
Atomic Force Microscopy [AFM]
AFM-Raman
Nanoparticle Tracking Analysis
Electrochemistry
The Story of pH (Link to dedicated website)
The Story of Ion
The Story of ORP
The Story of Conductivity
The Story of Salt
The Story of Dissolved Oxygen
Physisorption
Surface Area Measurements
Particle Analysis
Dynamic Light Scattering
Static Light Scattering
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Image Analysis of Particles
Nanoparticle Tracking Analysis
Centrifugal Sedimentation
Elemental Analysis
Glow Discharge Optical Emission Spectroscopy (GDOES)
Inductively Coupled Plasma - Optical Emission Spectroscopy (ICP-OES)
Carbon/Sulfur & Oxygen/Nitrogen/Hydrogen Analysis
X-ray Fluorescence Spectroscopy (XRF)
Surface Plasmon Resonance
Surface Plasmon Resonance imaging
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eBooks
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Science in Action Series
Cryogenics and Multimodal Microspectroscopy — Filtering out the Noise
Women in Science Series
Spectroscopy Matters
Jobin Yvon History - 200 Years of Optical Innovation
Spectroscopic Insights Blog
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