Applications

Colocalized AFM-Raman Analysis of 2D Materials Heterostructures

True colocalized topographic, electrical, and chemical characterization of Van der Waals heterostructures

Colocalized AFM-Raman Analysis of 2D Materials Heterostructures

This application note reports on colocalized AFM-Raman measurements of vertical Van der Waals heterostructures of 2D materials: hBN/graphene/WSe2 and graphite gate/hBN/bilayer graphene/hBN. Topographic, contact potential difference, and Raman data are generated on same location with the same tip using a fully integrated AFM-Raman microscope, the new SignatureSPM.

Related Products

SignatureSPM
SignatureSPM

Scanning Probe Microscope with Chemical Signature

LabRAM Soleil Nano
LabRAM Soleil Nano

Real-time and Direct Correlative Nanoscopy

LabRAM Odyssey Nano
LabRAM Odyssey Nano

AFM-Raman for physical and chemical imaging

XploRA Nano
XploRA Nano

AFM-Raman for Physical and Chemical imaging

OmegaScope
OmegaScope

The AFM optical platform

Pedido de Informação

Você tem alguma dúvida ou solicitação? Utilize este formulário para entrar em contato com nossos especialistas.

* Esses campos são obrigatórios.

Corporate