Metals

Precious Metals

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Precious metals include gold, silver, platinum, and palladium. These metals are prized for their rarity, excellent conductivity, resistance to corrosion, and aesthetic appeal. Each metal has distinct characteristics that make it suitable for specific applications, and their properties can be refined and enhanced through advanced technological processes to fit industries from electronics to jewelry.

The constant improvement and analysis of precious metals are essential to optimize their performance and extend their applications:

  • Elemental Analysis: Identifies the precise chemical composition of precious metals, ensuring the purity and detection of any alloying elements or impurities that may affect their properties.
  • Particle Analysis: Examines microstructural features, identifying any inclusions or defects that can impact the metal's performance and durability, especially in high-precision applications like electronics and medical devices.
  • Structural Analysis: Assesses mechanical properties such as hardness, ductility, and tensile strength. This analysis is vital for applications requiring high mechanical reliability, such as aerospace components.
  • Surface Analysis: Evaluates the metal's surface characteristics, including its resistance to tarnishing and corrosion. This is particularly important for jewelry and high-end electronics, where aesthetic quality and longevity are critical.

HORIBA Solutions

HORIBA provides advanced analytical instruments and solutions that significantly aid in the analysis of precious metals.

EMIA-Expert
EMIA-Expert

Carbon/Sulfur Analyzer
(Flagship High-Accuracy Model)

EMGA-Expert
EMGA-Expert

Oxygen/Nitrogen/Hydrogen Analyzer
(Flagship High-Accuracy Model)

GD-Profiler 2™辉光放电光谱仪
GD-Profiler 2™辉光放电光谱仪

用辉光放电光谱仪去发现一个崭新的信息世界

XGT-9000
XGT-9000

微区X射线荧光分析仪

Partica LA-960V2
Partica LA-960V2

激光粒度分析仪

nanoPartica SZ-100V2
nanoPartica SZ-100V2

纳米粒度及Zeta电位分析仪

LabRAM Soleil
LabRAM Soleil

高分辨超灵敏智能拉曼成像仪

SignatureSPM
SignatureSPM

Scanning Probe Microscope with Chemical Signature

EMIA-Pro
EMIA-Pro

Carbon/Sulfur Analyzer (Entry Model)

EMGA-Pro
EMGA-Pro

Oxygen/Nitrogen Analyzer (Entry Model)

MESA-50
MESA-50

X 射线荧光分析仪

XploRA™ PLUS
XploRA™ PLUS

高性能全自动拉曼光谱

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