Applications

Colocalized AFM-Raman Analysis of Graphene

True colocalized topographic, electrical, and chemical characterization of exfoliated graphene flakes

Colocalized AFM-Raman Analysis of Graphene

This application note reports on true colocalized AFM-Raman measurements of exfoliated graphene flakes on SiO2/Si. Topographic, contact potential difference, and Raman data are obtained on same location with the same tip using a fully integrated AFM-Raman microscope, the new SignatureSPM.

Related Products

SignatureSPM
SignatureSPM

Scanning Probe Microscope with Chemical Signature

LabRAM Soleil Nano
LabRAM Soleil Nano

纳米拉曼光谱仪

LabRAM Odyssey Nano
LabRAM Odyssey Nano

纳米拉曼光谱仪

XploRA Nano
XploRA Nano

纳米拉曼光谱仪

OmegaScope
OmegaScope

AFM光学工作站

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