颗粒检测系统

血细胞分析系统

Comprehensive Particle Detection for Semiconductor Manufacturing Processes

For Semiconductor manufacturing processes, where the most advanced micro-fabrication techniques are used, quality management is a critical issue that directly impacts business.

It is important to constantly inspect for the presence of particle contamination. By making use of advanced analysis technologies, HORIBA provides cost effective leading-edge particle detection solution to semiconductor manufactures.

相关产品

PD10-EX
PD10-EX

Reticle / Mask Particle Detection System

RP-1
RP-1

光罩/掩膜颗粒去除设备

Xtrology
Xtrology

全自动薄膜量测系统

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