Production processes are evolving rapidly which is reflected in a growing need for high-grade evaluation and analysis of a wide range of thin films and complex multilayer structures. HORIBA systems are capable of measuring film properties including stress, thickness and optical constants of complex and multilayer films and ultra-thin SiO2 films.
Máte nějaké dotazy nebo požadavky? Pomocí tohoto formuláře kontaktujte naše specialisty.
