We compared the element distribution when changing the Al concentration during the formation of the intermediate layer AlGaAs film. It captures differences of more than a few percent in atomic ratio. In addition, we were able to perform the evaluation in a very short measurement time of 2 seconds.
Spectromètre d'émission optique à décharge luminescente RF pulsée
Do you have any questions or requests? Use this form to contact our specialists.
You might also like to know
