Semiconductors

Carrier Lifetime Analysis for Semiconductor Raw Materials

<< Back to Raw Materials for Semiconductors

Deposition of highly crystalline SiC epitaxial films is essential for high-performance compound semiconductors, and we will introduce a non-destructive and precise method for analyzing crystallinity after deposition.

SiC carrier lifetime analysis
- Carrier lifetime analysis of different SiC film formation conditions by PL lifetime measurement

Fluorescence lifetime measurement device DeltaFlex

Observe differences in carrier life by measuring PL life
Diverse light source wavelength repertoire
Supports a wide range of PL life from picoseconds to several seconds

DeltaFlex

TCSPC Lifetime Fluorometer

Request for Information

Do you have any questions or requests? Use this form to contact our specialists.

First name

Last name *

Company or Institution *

Postal code *

City

Country/Region *

State

Email address *

Phone

HORIBA Department

Your message *

I have read and agree to the HORIBA privacy notice

* These fields are mandatory.

Fluorescence Lifetime

Our research-grade fluorescence lifetime spectrofluorometers are compact, benchtop or modular, and customizable for any sort of fluorometry, be it fluorescence detection or phosphorescence studies that your research requires.