The combination of Atomic Force Microscopy (AFM) and Raman spectroscopy provides deep insights into the complex properties of various materials. While Raman spectroscopy facilitates the chemical characterization of compounds, interfaces and complex matrices, offering crucial insights into molecular structures and compositions, including microscale contaminants and trace materials. AFM provides essential data on topography and mechanical properties, such as surface texture, adhesion, roughness, and stiffness at the nanoscale.

Traditionally, users must rely on multiple instruments to gather such comprehensive analysis. HORIBA’s AFM-Raman system stands out as a uniquely multimodal tool, integrating an automated AFM with a Raman/photoluminescence spectrometer, providing precise pixel-to-pixel correlation between structural and chemical information in a single scan.

This colocalized approach is particularly valuable in applications such as polymer analysis, where both surface morphology and chemical composition are critical; in semiconductor manufacturing, for detecting defects and characterizing materials at the nanoscale; and in life sciences, for studying biological membranes, cells, and tissue samples. Additionally, it’s ideal for battery research, where understanding both the structural and chemical evolution of materials is key to improving performance.

SPEAKER: João Lucas Rangel currently serves as the AFM & AFM-Raman global product manager at HORIBA and holds a PhD in biomedical engineering. Specializing in Raman, infrared, and fluorescence spectroscopies, his PhD research was focused on skin dermis biochemistry changes.