1 - Load Sample
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2 - Run MeasurementSelect your experimental recipe in the ready to use application
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3 - Accurate Results
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Intuitive Auto-Soft Interface for the Auto SE and Smart SE
The HORIBA Smart SE and Auto SE spectroscopic ellipsometers also include the easy-to-use Auto Soft interface designed for fast and easy routine thin film measurement and characterization.
All of HORIBA Scientific’s spectroscopic ellipsometers are driven by the powerful and advanced DeltaPsi 2 software. The HORIBA Smart SE and Auto SE spectroscopic ellipsometers also include the intuitive Auto Soft interface, designed for fast and easy routine thin film analysis with just one push of a button.
Key Features:
The Auto-Soft interface contains just four icons for easy navigation:
System Control, Experimental Protocol, Data Management, and Maintenance. Also included is an icon to directly link to the advanced DeltaPsi 2 software platform, which is included with every Horiba spectroscopic ellipsometer.
Analyzing data with the Auto-Soft software consists of just three easy steps:
1. Load and align your sample using the system control screen
2. Choose the experimental protocol which best suits your sample
3. Obtain a report of the analysis results in just seconds, complete with a user-defined pass-fail criteria
The powerful DeltaPsi 2 software platform allows users to create or modify acquisition routines, models, and report templates for use in new or existing experimental protocols. DeltaPsi 2 also provides the user with more advanced functions designed to measure and characterize complex samples such as periodic structures, alloys, anisotropic layers, graded index layers, and much more! For more information on DeltaPsi 2, please click here.
1 - Load Sample
| |
2 - Run MeasurementSelect your experimental recipe in the ready to use application
| |
3 - Accurate Results
|
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Spectroscopic Ellipsometer for Simple Thin Film Measurement
Glow Discharge Optical Emission Spectrometer
Confocal Raman Microscope
Raman Microscope
Camera Endpoint Monitor based on Real Time Laser Interferometry
X선 형광 분석기
X선 형광 분석기
Powerful and Cost Effective Spectroscopic Ellipsometer
Spectroscopic Ellipsometer from FUV to NIR: 190 to 2100 nm
X선 분석 현미경(Micro-XRF)
X선 분석 현미경 초대형 챔버 모델
Raman Spectrometer - Confocal Raman Microscope