Scientific devices and new analytical methods are developing at a rapid pace. Our experienced specialists and the state-of-the-art analytical equipment in our modern analytical laboratory can help you keep pace, whether it’s conducting feasibility studies, recurring analytical measurements or an extensive test series before purchasing a device.
Consult with our experts to find out how HORIBA can tackle your analytical challenges.
With a high spatial resolution of <1 μm, Raman spectroscopy is an important tool for non-destructive material analysis and phase characterization. Take advantage of our wide variety of Raman microscopes equipped with multiple laser excitation wavelengths that create 2D or 3D mappings and Raman images. In addition, our team has a range of portable fiber-coupled measurement probes ready for individual measuring tasks in process analysis – also possible at your site or in the field!
The determination of grain and particle size distributions of raw materials and finished products are essential in many areas. Whether particles in solutions, emulsions, pastes or as a dry powder – using laser-based static and dynamic scattering, we provide characterization in an extremely wide size range from 10 nm (in dry state from 100 nm) up to 3000 μm.
Typical applications of luminescence and fluorescence spectroscopy can be found in the most diverse areas, such as food technology, pharmacy, materials science, nanotechnology, and also in water analysis or forensic fluorescence spectroscopy. Our application lab features state-of-the-art spectrometer analysis for recording "steady-state" excitation and emission spectra as well as time-resolved fluorescence spectra of macro samples, such as powders and liquids. We also carry out laser-induced and therefore spatially resolved photoluminescence mapping, e.g. for the characterization of 2D materials, semiconductors or minerals. Our mobile fluorescence spectrometer systems can be employed at your site when sample transport is not possible.
X-ray fluorescence analysis (XRF) is one of the most commonly used methods for qualitative and quantitative determination of elemental composition in material analysis, as the method is non-destructive and no digestion is required. Typical detection limit is around 1 ppm. With the employed micro XRF, you will receive mapping/imaging in addition to a transmission image and also spatial information about element distributions. The range of measurable elements includes a wide scope of the periodic table, from carbon to uranium. Accurate spatially resolved quantification of the chemical composition is heavily matrix-dependent and may require suitable reference materials.
We’re here to answer your analytical questions with our customized solutions for concept studies and recurring serial measurements. The HORIBA application team is your trusted partner.
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