Applications

Colocalized AFM-Raman Analysis of Graphene

True colocalized topographic, electrical, and chemical characterization of exfoliated graphene flakes

Colocalized AFM-Raman Analysis of Graphene

This application note reports on true colocalized AFM-Raman measurements of exfoliated graphene flakes on SiO2/Si. Topographic, contact potential difference, and Raman data are obtained on same location with the same tip using a fully integrated AFM-Raman microscope, the new SignatureSPM.

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