Semiconductors

CMP slurry particle size analysis

Slurry particle size analysis of tens of nm using centrifugal sedimentation method

We detected differences in single nm levels of colloidal silica. Effective for identifying the presence or absence of a coating agent on the surface of colloidal silica.

Centrifugal nanoparticle analyzer Partica CENTRIFUGE

Realizes precise particle size distribution measurement from undiluted solutions to dilute samples (corresponding particle sizes: 10 nm to 40 μm)
Captures even small amounts of foreign matter and agglomerates.
Equipped with a cooling mechanism that allows stable measurement even over long periods of time.

Partica CENTRIFUGE

Centrifugal Nanoparticle Analyzer

留言諮詢

如您有任何疑問，请在此留下詳細需求或問題，我們將竭誠您服務。

姓

名 *

公司院校 *

郵遞區號 *

城市

國家/地區 *

州/省

E-Mail *

電話

HORIBA部門

您的詳细需求 *

我已閱讀並同意HORIBA的隱私政策

* 這些欄位為必填項目。